Hawken SEM Facility

Hawken SEM Facility

The Hawken laboratory is the scanning electron microscopy heart of the CMM. It offers a diverse range of scanning electron microscopes (SEM) for a broad range of sample types and research requirements. From simple tungsten filament, quick and easy, bench top imaging machines; through Cryo-SEM and low vacuum analytical SEM for the examination of difficult specimens; and on to various field emission SEMs for very high resolution work. Many SEMs are equipped with extra detector systems to increase their analytical ability. These include EDS/EDX for elemental analysis, EBSD for crystallographic analysis, and a five spectrometer wavelength dispersive microprobe that provides accurate quantitative elemental analysis from polished specimens. The ability to manufacture materials with e-beam lithography, or to examine specimens with atomic force microscopy (AFM) are some complementary tools also available in the Hawken laboratory.

Instrumentation:

• JEOL 6300 SEM. Cold Field Emission, 0-30kV, Digital image capture
• JEOL 6460 SEM. Tungsten filament, 0-30kV, EDS, Low Vacuum
• JEOL 8200 EPMA. Tungsten filament, 0-30kV, EDS, 5 WDS
• Philips XL-30 SEM. LaB6 emitter, 0-30kV, EDS, Cryo-SEM
• JEOL 7001 SEM. Schottky Field Emission, 0-30kV, EDS, WDS, In -Lens UED
• JEOL 6610 SEM LaB6 emitter, 0-30kV, Oxford SDD EDS with Integrated EBSD
• JEOL NeoScope SEM. Tungsten filament 5-15kV, Bench top SEM, Low Vacuum, Digital image capture
• VEECO Multi-Mode SPM, Atomic Force Microscope
• JEOL 7800 SEM. Schooky Field Emission, 0-30kV with two in-lens detectors

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