Chemistry: X-ray Analysis Facility

 

The X-ray analysis facility at CMM is based on level two of the Chemistry building and provides a range of x-ray techniques for studying chemical composition, nano-scale size and crystalline phase in a range of materials.  The facility is comprised of two powder x-ray diffractometers, a dedicated small-angle x-ray scattering instrument and an x-ray photoelectron spectrometer.  In addition the facility provides access to a range of commercial software packages for data processing and analysis as well as a breadth of knowledge and expertise for these, and many related techniques.  In late 2011 the facility will commission a state-of-the-art, high-throughput XRD (Di Vinci D8) which will see a significant increase in our XRD capabilities.

 

Instrumentation:

Two Bruker D8 (Di Vinci and Advance) powder x-ray diffractometers

An Anton Paar SAXSess small-angle x-ray scattering instrument

A Kratos Axis Ultra x-ray photoelectron spectrometer

 

Additional Facilities:

Two computer workstations for data analysis and processing which include

·         Bruker data processing suites – EVA and LEPTOS

·         TOPAS – Rietveld refinement software

·         Findit and ICDD databases

·         Casa XPS

 

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