Scanning Electron Microscope (SEM)
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials.
By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterisation of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed.
There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM which, in combination, provide a powerful analytical approach for many research or quality-control applications.
|Scanning Electron Microscope (SEM) section|