Jeol JSM-7001F SEM
The 7001 is a Field Emission Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun that is optimised for analytical applications. It offers very high beam currents with excellent stability even at lower acceleration voltages. It is fitted with two x-ray detectors: a conventional "user-friendly" EDS system; and a high resolution system that is ideal for observing low energy x-rays. Resolution is 1.2nm at 30kV and 2.0nm at 1kV using the inbuilt beam decelerator fitted to the stage.