JEOL JSM-6610

This is a high resolution, analytical Scanning Electron Microscope that can reach 2.5nm resolution at an accelerating voltage of 30kV.  The electron source is a LaB6 gun.  It has a brighter source than the tungsten hairpin gun.  Bright, high quality images can be obtained at all kV ranges from 1-30kV.  It has a wide magnification range (up to 300,000 times) to observe a variety of samples from 10cm in diameter to nano-structures at very high magnification.   This instrument is an ideal analytical system as it has an Oxford 50mm² X-Max SDD x-ray detector attached that enables simultaneous imaging and elemental analysis, at high count rates with 125eV energy resolution. It has also has an integrated Oxford/HKL EBSD detector for crystallographic analysis with nanoscale resolution.

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